Conference Publication Details
Mandatory Fields
Andorko, I;Corcoran, P;Bigioi, P
2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE)
Proposal of a Universal Test Scene for Depth Map Evaluation
2013
January
Published
1
()
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ALGORITHMS
151
Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.
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